Panalytical recently introduced upgraded benchtop X-ray fluorescence (XRF) spectrometers incorporating the latest advances in excitation and detection technology. The new Epsilon 3X instruments have been designed for reliable and simple operation while delivering analytical performance across the periodic table.
The Epsilon 3X is equipped with 50-kilovolt excitation and a high-resolution silicon drift detector to enable analysis of elements from sodium to americium. The Epsilon 3XLE is configured with the more powerful SDD Ultra silicon drift detector, which makes analysis of ultra-light elements like carbon, nitrogen and oxygen possible. As inherent to XRF analysis, elements can be present in concentrations ranging from parts per million to 100 percent, with little or no sample preparation required.
Advanced spectrum processing and state-of-the-art algorithms provide accurate and fully traceable data. A variety of software options for standardless analysis, fingerprinting, regulatory compliance and multi-layer analysis are available.
"The smart combination of the latest excitation and detection technologies of the new Epsilon 3X benchtop spectrometers provides ultimate light-element performance, matching – and sometimes even surpassing — the analytical performance of larger, more powerful spectrometers," said Simon Milner, product marketing manager for Panalytical. "These cost-effective and highly flexible analytical tools are suitable for applications in a wide range of industries such as cement production, mineral beneficiation or polymer production."
For more information, visit www.panalytical.com.
