Spectro Analytical Instruments recently introduced a new line of energy-dispersive X-ray fluorescence (ED-XRF) spectrometers for multi-elemental analysis of major, minor and trace element concentrations.
The Spectro XEPOS spectrometers are designed to excel at critical tasks from rapid screening elemental analysis for environmental and waste sampling to demanding applications in research, academia and geological science. They also support precise product quality control for a variety of applications such as chemical and petrochemical production, and the manufacture of cement, cosmetics, food, pharmaceuticals and more.
The spectrometers' improved sensitivity helps to boost precision while delivering fast and accurate analysis of a wide range of elements. Enhanced with a new high-count detector and tube designs, as well as minimized backgrounds, the analyzers' adaptive excitation technology enables low limits of detection for a wide range of elements.
Unlike most ED-XRF elemental analyzers, the X-ray tubes in the Spectro XEPOS spectrometers remain powered on between measurements to prevent on/off variations from affecting readings. This ensures long-term stability, a high degree of precision in elemental analysis and improved analytical accuracy for concentrations from trace elements to major components.
For operators who require speed more than utmost precision, the Spectro XEPOS analyzers can cut measurement times while still maintaining precision levels comparable to traditional ED-XRF spectrometers. The system's high speed helps to achieve analyses of most samples within a few minutes.
The redesigned operating software provides ease and power, while the new TurboQuant II software analyzes practically any unknown liquid, powder or solid sample.
Optional AMECARE M2M (machine-to-machine) support extends the new analyzers' self-diagnostic functions with proactive alerts backed by direct connection with a remote Spectro service expert's PC.
Four advanced versions are available, enabling users to prioritize their selection according to measurement speed, ultimate precision or groups of targeted elements in specific matrices.
For more information, visit www.spectro.com.
